Researcher Portfolio
Lohs, A.
Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society, Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society
Researcher Profile
Position: Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society
Position: Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society
Researcher ID: https://pure.mpg.de/cone/persons/resource/persons109837
Publications
(1 - 25 of 58)
: Budke, M., Renken, V., Liebl, H., Rangelov, G., & Donath, M. (2007). Inverse photoemission with energy resolution better than 200 meV. Review of Scientific Instruments, 78: 083903. Retrieved from http://dx.doi.org/10.1063/1.2771096. [PubMan] : Liebl, H., & Senftinger, B. (1991). Low-Energy Electron Microscope of Novel Design. Ultramicroscopy, 36, 91-98. [PubMan] : Liebl, H., & Senftinger, B. (1990). Low-Energy Electron Microscope of Novel Design. In Proc. of the 12. International Congress for Electron Microscopy (pp. 352-353). San Francisco Press Inc. [PubMan] : Senftinger, B., & Liebl, H. (1990). Performance Evaluation of a Novel Type of Low-Energy Electron Microscope. In Proc. of the 12. International Congress for Electron Microscopy (pp. 354-355). San Francisco Press Inc. [PubMan] : Liebl, H., Senftinger, P., Staib, P., & Weiss, H. (1990). Compact Cs+ Ion Microsource. In A. Benninghoven (Ed. ), Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry (pp. 883-886). Chichester: Wiley. [PubMan] : Liebl, H. (1990). On the Image Aberration of an Accelerating Central Field. Optik, 85, 2, 87. [PubMan] : Liebl, H. (1989). Ion Probe Microscopy. Advances in Optical and Electron Microscopy, 11, 101-151. [PubMan] : Liebl, H. (1989). The Image Aberration Caused by the Acceleration Field Between Concentric Spherical Electrodes. Optik, 83, 4, 129-133. [PubMan] : Liebl, H. (1988). On the Image Aberration of the Uniform Acceleration Field of an Emission Lens. Optik, Bd. 80, Nr. 1, 4-8. [PubMan] : Liebl, H., & Senftinger, B. (1988). Cs_exp.+ Ion Microsource. Review of Scientific Instruments, 59, 10, 2174-2176. [PubMan] : Kolac, U., Donath, M., Ertl, K., Liebl, H., & Dose, V. (1988). High-Performance GaAs Polarized Electron Source for Use in Inverse Photoemission Spectroscopy. Review of Scientific Instruments, 59, 9, 1933-1940. [PubMan] : Liebl, H. (1987). A Compact Double-Focusing Mass Spectrometer. Nuclear Instruments and Methdos in Physics Research. A, 258, 323-326. [PubMan] : Liebl, H. (1987). Transfer Matrix for the Trajectories of Charged Particles Between Concentric, Spherical, Equipotential Surfaces. Optik, 76, 4, 170-172. [PubMan] : Liebl, H., Bohdansky, J., Roth, J., & Dose, V. (1987). Deceleration Ion Optical Systems for Sputtering Measurements between 50 eV as Function of Angle of Incidence. Review of Scientific Instruments, 58, 10, 1830-1832. [PubMan] : Liebl, H., & Weiss, H. (1987). On a Combined Electrostatic Objective and Emission Lens for Charged Particle of Oposite or Equal Polarity: International Symposium. In Electron Optics (pp. 154-161). [PubMan] : Liebl, H. (1986). Ion Optics of Submicron Ion Beams. Scanning Electron Microscopy, 3, 793-798. [PubMan] : Liebl, H., & Benninghoven, A. (1984). Ion Gun Systems for Submicron SIMS. In Secondary Ion Mass Spectrometry SIMS IV (pp. 114). [PubMan] : Liebl, H. (1984). High-Resolution Scanning Ion Microscopy and Secondary-Ion Mass Spectrometry: Problems and Solutions. Scanning Electron Microscopy, 11, 519. [PubMan] : Liebl, H. (1983). Combined Electrostatic Objective and Emission Lenses for Microcharacterization of Surfaces. International Journal of Mass Spectrometry and Ion Physics, 46, 511. [PubMan] : Liebl, H. (1983). Grenzen der Ortsaufloesung bei SIMS. Fresenius Zeitschrift fuer Analytische Chemie, 314, 244. [PubMan] : Liebl, H. (1983). Ion Optics of Ion Microprobe Instruments. Vacuum, 33, 525. [PubMan] : Liebl, H. (1981). Beam Optics in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research, 187, 143. [PubMan] : Bentz, B. L., Weiß, H., & Liebl, H.(1981). Cs+ ion source for secondary ion mass spectrometry (IPP 9/37). Garching: Max-Planck-Institut für Plasmaphysik. [PubMan] : Liebl, H. (1981). Optimum Sample Utilization in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research, 191, 183. [PubMan] : Liebl, H. (1981). Comment on ' An Analysis of Some Solution Techniques for Electrostatic Coaxial Lenses '. Optik, 58, 433. [PubMan]