Researcher Portfolio
Lalli, Roberto
Department Structural Changes in Systems of Knowledge, Max Planck Institute for the History of Science, Max Planck Society, External, Max Planck Institute for the History of Science, Max Planck Society
Researcher Profile
Position: Department Structural Changes in Systems of Knowledge, Max Planck Institute for the History of Science, Max Planck Society
Position: External, Max Planck Institute for the History of Science, Max Planck Society
Additional IDs: ORCID:
https://orcid.org/0000-0002-5854-3484
Researcher ID: https://pure.mpg.de/cone/persons/resource/persons194156
Publications
(1 - 25 of 58)
: Budke, M., Renken, V., Liebl, H., Rangelov, G., & Donath, M. (2007). Inverse photoemission with energy resolution better than 200 meV. Review of Scientific Instruments, 78: 083903. Retrieved from http://dx.doi.org/10.1063/1.2771096. [PubMan] : Liebl, H., & Senftinger, B. (1991). Low-Energy Electron Microscope of Novel Design. Ultramicroscopy, 36, 91-98. [PubMan] : Liebl, H., & Senftinger, B. (1990). Low-Energy Electron Microscope of Novel Design. In Proc. of the 12. International Congress for Electron Microscopy (pp. 352-353). San Francisco Press Inc. [PubMan] : Senftinger, B., & Liebl, H. (1990). Performance Evaluation of a Novel Type of Low-Energy Electron Microscope. In Proc. of the 12. International Congress for Electron Microscopy (pp. 354-355). San Francisco Press Inc. [PubMan] : Liebl, H., Senftinger, P., Staib, P., & Weiss, H. (1990). Compact Cs+ Ion Microsource. In A. Benninghoven (Ed. ), Secondary Ion Mass Spectrometry. Proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry (pp. 883-886). Chichester: Wiley. [PubMan] : Liebl, H. (1990). On the Image Aberration of an Accelerating Central Field. Optik, 85, 2, 87. [PubMan] : Liebl, H. (1989). Ion Probe Microscopy. Advances in Optical and Electron Microscopy, 11, 101-151. [PubMan] : Liebl, H. (1989). The Image Aberration Caused by the Acceleration Field Between Concentric Spherical Electrodes. Optik, 83, 4, 129-133. [PubMan] : Liebl, H. (1988). On the Image Aberration of the Uniform Acceleration Field of an Emission Lens. Optik, Bd. 80, Nr. 1, 4-8. [PubMan] : Liebl, H., & Senftinger, B. (1988). Cs_exp.+ Ion Microsource. Review of Scientific Instruments, 59, 10, 2174-2176. [PubMan] : Kolac, U., Donath, M., Ertl, K., Liebl, H., & Dose, V. (1988). High-Performance GaAs Polarized Electron Source for Use in Inverse Photoemission Spectroscopy. Review of Scientific Instruments, 59, 9, 1933-1940. [PubMan] : Liebl, H. (1987). A Compact Double-Focusing Mass Spectrometer. Nuclear Instruments and Methdos in Physics Research. A, 258, 323-326. [PubMan] : Liebl, H. (1987). Transfer Matrix for the Trajectories of Charged Particles Between Concentric, Spherical, Equipotential Surfaces. Optik, 76, 4, 170-172. [PubMan] : Liebl, H., Bohdansky, J., Roth, J., & Dose, V. (1987). Deceleration Ion Optical Systems for Sputtering Measurements between 50 eV as Function of Angle of Incidence. Review of Scientific Instruments, 58, 10, 1830-1832. [PubMan] : Liebl, H., & Weiss, H. (1987). On a Combined Electrostatic Objective and Emission Lens for Charged Particle of Oposite or Equal Polarity: International Symposium. In Electron Optics (pp. 154-161). [PubMan] : Liebl, H. (1986). Ion Optics of Submicron Ion Beams. Scanning Electron Microscopy, 3, 793-798. [PubMan] : Liebl, H., & Benninghoven, A. (1984). Ion Gun Systems for Submicron SIMS. In Secondary Ion Mass Spectrometry SIMS IV (pp. 114). [PubMan] : Liebl, H. (1984). High-Resolution Scanning Ion Microscopy and Secondary-Ion Mass Spectrometry: Problems and Solutions. Scanning Electron Microscopy, 11, 519. [PubMan] : Liebl, H. (1983). Combined Electrostatic Objective and Emission Lenses for Microcharacterization of Surfaces. International Journal of Mass Spectrometry and Ion Physics, 46, 511. [PubMan] : Liebl, H. (1983). Grenzen der Ortsaufloesung bei SIMS. Fresenius Zeitschrift fuer Analytische Chemie, 314, 244. [PubMan] : Liebl, H. (1983). Ion Optics of Ion Microprobe Instruments. Vacuum, 33, 525. [PubMan] : Liebl, H. (1981). Beam Optics in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research, 187, 143. [PubMan] : Bentz, B. L., Weiß, H., & Liebl, H.(1981). Cs+ ion source for secondary ion mass spectrometry (IPP 9/37). Garching: Max-Planck-Institut für Plasmaphysik. [PubMan] : Liebl, H. (1981). Optimum Sample Utilization in Secondary Ion Mass Spectrometry. Nuclear Instruments and Methods in Physics Research, 191, 183. [PubMan] : Liebl, H. (1981). Comment on ' An Analysis of Some Solution Techniques for Electrostatic Coaxial Lenses '. Optik, 58, 433. [PubMan]