Researcher Portfolio

 
   

Vurpillot, François

GPM UMR 6634 CNRS, Université et INSA de Rouen, Rouen, France, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France, The Sir William Dunn School of Pathology, University of Oxford, Oxford, UK  

 

Researcher Profile

 
Position: The Sir William Dunn School of Pathology, University of Oxford, Oxford, UK
Position: GPM UMR 6634 CNRS, Université et INSA de Rouen, Rouen, France
Position: Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France
Position: Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
Researcher ID: https://pure.mpg.de/cone/persons/resource/persons208569

External references

 

Publications

 
 
 : Vurpillot, F., Rousseau, L., Hatzoglou, C., Normand, A., Gault, B., & Cerezo, A. (2023). Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy. Microscopy and Microanalysis, 29(Supplement_1), 605-606. doi:10.1093/micmic/ozad067.293. [PubMan] : Rousseau, L., Normand, A., Morgado, F. F., Scisly Søreide, H.-S.-M., Stephenson, L., Hatzoglou, C., Da Costa, G., Tehrani, K., Freysoldt, C., Gault, B., & Vurpillot, F. (2023). Introducing field evaporation energy loss spectroscopy. Communications Physics, 6: 100. doi:10.1038/s42005-023-01203-2. [PubMan] : Gault, B., Klaes, B., Morgado, F. F., Freysoldt, C., Li, Y., De Geuser, F., Stephenson, L., & Vurpillot, F. (2022). Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods. Microscopy and Microanalysis, 28(4), 1116-1126. doi:10.1017/S1431927621012952. [PubMan] : Morgado, F. F., Katnagallu, S., Freysoldt, C., Klaes, B., Vurpillot, F., Neugebauer, J., Raabe, D., Neumeier, S., Gault, B., & Stephenson, L. (2021). Revealing atomic-scale vacancy-solute interaction in nickel. Scripta Materialia, 203: 114036. doi:10.1016/j.scriptamat.2021.114036. [PubMan] : Morgado, F. F., Katnagallu, S., Freysoldt, C., Klaes, B., Vurpillot, F., Neugebauer, J., Raabe, D., Neumeier, S., Gault, B., & Stephenson, L. (2021). Corrigendum to Revealing atomic-scale vacancy-solute interaction in nickel (Scripta Materialia (2021) 203, (114036) (S135964622100316X), (10.1016/j.scriptamat.2021.114036)). Scripta Materialia, 205: 114213. doi:10.1016/j.scriptamat.2021.114213. [PubMan] : Klaes, B., Lardé, R., Delaroche, F., Parviainen, S., Rolland, N., Katnagallu, S., Gault, B., & Vurpillot, F. (2021). A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications, 260: 107317. doi:10.1016/j.cpc.2020.107317. [PubMan] : Klaes, B., Renaux, J., Lardé, R., Delaroche, F., Morgado, F. F., Stephenson, L., Gault, B., & Vurpillot, F. (2021). Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi. Microscopy and Microanalysis, 1-9. doi:10.1017/S1431927621012629. [PubMan] : Rousseau, L., Normand, A., Morgado, F. F., Stephenson, L., Gault, B., Tehrani, K., & Vurpillot, F. (2020). Dynamic Effects in Voltage Pulsed Atom Probe. Microscopy and Microanalysis, 26(6), 1133-1146. doi:10.1017/S1431927620024587. [PubMan] : Dubosq, R., Gault, B., Hatzoglou, C., Schweinar, K., Vurpillot, F., Rogowitz, A., Rantitsch, G., & Schneider, D. (2020). Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations. Ultramicroscopy, 218: 113092. doi:10.1016/j.ultramic.2020.113092. [PubMan] : Wang, X., Hatzoglou, C., Sneed, B., Fan, Z., Guo, W., Jin, K., Chen, D., Bei, H., Wang, Y., Weber, W. J., Zhang, Y., Gault, B., More, K. L., Vurpillot, F., & Poplawsky, J. D. (2020). Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements. Nature Communications, 11: 1022. doi:10.1038/s41467-020-14832-w. [PubMan] : Katnagallu, S., Stephenson, L., Mouton, I., Freysoldt, C., Subramanyam, A. P. A., Jenke, J., Ladines, A. N. C., Neumeier, S., Hammerschmidt, T., Drautz, R., Neugebauer, J., Vurpillot, F., Raabe, D., & Gault, B. (2019). Imaging individual solute atoms at crystalline imperfections in metals. New Journal of Physics, 21(12): 123020. doi:10.1088/1367-2630/ab5cc4. [PubMan] : Peng, Z., Zanuttini, D., Gervais, B., Jacquet, E., Blum, I., Choi, P.-P., Raabe, D., Vurpillot, F., & Gault, B. (2019). Unraveling the Metastability of Cn2+ (n = 2-4) Clusters. The Journal of Physical Chemistry Letters, 10(3), 581-588. doi:10.1021/acs.jpclett.8b03449. [PubMan] : Peng, Z., Lu, Y., Hatzoglou, C., Kwiatkowski da Silva, A., Vurpillot, F., Ponge, D., Raabe, D., & Gault, B. (2019). An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, 25(2), 389-400. doi:10.1017/S1431927618016112. [PubMan] : Peng, Z., Lu, Y., Hatzoglou, C., Kwiatkowski da Silva, A., Vurpillot, F., Ponge, D., Raabe, D., & Gault, B. (2019). An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, 25(2), 389-400. doi:10.1017/S1431927618016112. [PubMan] : Peng, Z., Lu, Y., Hatzoglou, C., Kwiatkowski da Silva, A., Vurpillot, F., Ponge, D., Raabe, D., & Gault, B. (2018). An automated computational approach for extraction in-plane compositional information of interface in atom probe tomography dataset. Talk presented at APT&M 2018 conference. Gaitherburg, MD, USA. 2018-06-10 - 2018-06-15. [PubMan] : Peng, Z., Vurpillot, F., Choi, P.-P., Li, Y., Raabe, D., & Gault, B. (2018). On the detection of multiple events in atom probe tomography. Ultramicroscopy, 189, 54-60. doi:10.1016/j.ultramic.2018.03.018. [PubMan] : Katnagallu, S., Dagan, M., Parviainen, S., Nematollahi, G. A., Grabowski, B., Bagot, P. A. J., Rolland, N., Neugebauer, J., Raabe, D., Vurpillot, F., Moody, M. P., & Gault, B. (2018). Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics, 51(10): 105601, pp. 1-10. doi:10.1088/1361-6463/aaaba6. [PubMan] : Gault, B., De Geuser, F., Katnagallu, S., Nematollahi, G. A., Dagan, M., Parviainen, S., Rusitzka, A. K., Johnson, E., Sundell, G., Andersson, M., Stephenson, L., Neugebauer, J., Moody, M. P., Vurpillot, F., & Raabe, D. (2017). Reconstructing field ion microscopy and atom probe data. Talk presented at Australian Atom Probe Workshop. Magnetic Island, Australia. 2017-06. [PubMan] : Parviainen, S., Dagan, M., Katnagallu, S., Gault, B., Moody, M. P., & Vurpillot, F. (2017). Atomistic Simulations of Surface Effects Under High Electric Fields. In Proceedings of Microscopy & Microanalysis 2017 (pp. 644-645). doi:10.1017/S1431927617003889. [PubMan] : Gault, B., Dagan, M., Katnagallu, S., De Geuser, F., Vurpillot, F., Raabe, D., & Moody, M. P. (2017). Revisiting Field Ion Microscopy. Talk presented at TMS 2017. San Diego, CA, USA. 2017-02-26 - 2017-03-02. [PubMan]