Researcher Portfolio
Lee, Dong-Hyun
Alloys for Additive Manufacturing, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, Department of Materials Science and Engineering, Chungnam National University, 34134, Daejeon, Republic of Korea, Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
Researcher Profile
Position: Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
Position: Alloys for Additive Manufacturing, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
Position: Department of Materials Science and Engineering, Chungnam National University, 34134, Daejeon, Republic of Korea
Researcher ID: https://pure.mpg.de/cone/persons/resource/persons213189
Publications
: Wang, H., Ogolla, C. O., Panchal, G., Hepp, M., Delacroix, S., Cruz, D., Kojda, D., Ciston, J., Ophus, C., Knop-Gericke, A., Habicht, K., Butz, B., & Strauss, V. (2022). Flexible CO2 Sensor Architecture with Selective Nitrogen Functionalities by One-Step Laser-Induced Conversion of Versatile Organic Ink. Advanced Functional Materials, (32): 2207406, pp. 1-12. doi:10.1002/adfm.202207406. [PubMan] : Khan, W., Betzler, S. B., Šipr, O., Ciston, J., Blaha, P., Scheu, C., & Minar, J. (2016). Theoretical and Experimental Study on the Optoelectronic Properties of Nb3O7(OH) and Nb2O5 Photoelectrodes. The Journal of Physical Chemistry C, 120(41), 23329-23338. doi:10.1021/acs.jpcc.6b06391. [PubMan] : Betzler, S. B., Harzer, T. P., Ciston, J., Dahmen, U., Dehm, G., & Scheu, C. (2016). Heat-Induced Phase Transformation of Three-Dimensional Nb3O7(OH) Superstructures: Effect of Atmosphere and Electron Beam. Crystal Growth & Design, 16(8), 4309-4317. doi:10.1021/acs.cgd.6b00386. [PubMan] : Dennenwaldt, T., Ciston, J., Dahmen, U., Ching, W.-Y., Pucher, F. J., Schnick, W., & Scheu, C. (2014). High-resolution spectroscopy of bonding in a novel BeP2N4 compound. Microscopy and Microanalysis, 20(3), 664-670. doi:10.1017/S1431927614000713. [PubMan]