Researcher Portfolio
Saxena, Alaukik
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, Defect Chemistry and Spectroscopy, Computational Materials Design, Max Planck Institute for Sustainable Materials, Max Planck Society, Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
Researcher Profile
Position: Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
Position: Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
Position: Defect Chemistry and Spectroscopy, Computational Materials Design, Max Planck Institute for Sustainable Materials, Max Planck Society
Researcher ID: https://pure.mpg.de/cone/persons/resource/persons265253
Publications
: Wang, H., Ogolla, C. O., Panchal, G., Hepp, M., Delacroix, S., Cruz, D., Kojda, D., Ciston, J., Ophus, C., Knop-Gericke, A., Habicht, K., Butz, B., & Strauss, V. (2022). Flexible CO2 Sensor Architecture with Selective Nitrogen Functionalities by One-Step Laser-Induced Conversion of Versatile Organic Ink. Advanced Functional Materials, (32): 2207406, pp. 1-12. doi:10.1002/adfm.202207406. [PubMan] : Khan, W., Betzler, S. B., Šipr, O., Ciston, J., Blaha, P., Scheu, C., & Minar, J. (2016). Theoretical and Experimental Study on the Optoelectronic Properties of Nb3O7(OH) and Nb2O5 Photoelectrodes. The Journal of Physical Chemistry C, 120(41), 23329-23338. doi:10.1021/acs.jpcc.6b06391. [PubMan] : Betzler, S. B., Harzer, T. P., Ciston, J., Dahmen, U., Dehm, G., & Scheu, C. (2016). Heat-Induced Phase Transformation of Three-Dimensional Nb3O7(OH) Superstructures: Effect of Atmosphere and Electron Beam. Crystal Growth & Design, 16(8), 4309-4317. doi:10.1021/acs.cgd.6b00386. [PubMan] : Dennenwaldt, T., Ciston, J., Dahmen, U., Ching, W.-Y., Pucher, F. J., Schnick, W., & Scheu, C. (2014). High-resolution spectroscopy of bonding in a novel BeP2N4 compound. Microscopy and Microanalysis, 20(3), 664-670. doi:10.1017/S1431927614000713. [PubMan]