Researcher Portfolio
Kelsch, Marion
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society
Researcher Profile
Position: Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society
Position: Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society
Researcher ID: https://pure.mpg.de/cone/persons/resource/persons75666
Publications
(1 - 25 of 28)
: Zhou, D., Sigle, W., Okunishi, E., Wang, Y., Kelsch, M., Habermeier, H.-U., & van Aken, P. A. (2014). Materials News: Interfacial chemistry and atomic arrangement of ZrO2-La2/3Sr1/3MnO3 pillar-matrix structures. APL Materials, 2: 127301. doi:10.1063/1.4904819. [PubMan] : Zhou, D., Sigle, W., Okunishi, E., Wang, Y., Kelsch, M., Habermeier, H.-U., & van Aken, P. A. (2014). Interfacial chemistry and atomic arrangement of ZrO2 − La2/3Sr1/3MnO3 pillar-matrix structures. APL Materials, 2: 127301. doi:10.1063/1.4904819. [PubMan] : Adepalli, K. K., Kelsch, M., Merkl, R., & Maier, J. (2014). Enhanced ionic conductivity in polycrystalline TiO2 by ‘‘one-dimensional doping’’. Physical Chemistry Chemical Physics, 16, 4942-4951. doi:10.1039/c3cp55054k. [PubMan] : Adepalli, K. K., Kelsch, M., Merkle, R., & Maier, J. (2013). Influence of line defects on the electrical properties of single crystal TiO2. Advanced Functional Materials, 23(14), 1798-1806. doi:10.1002adfm.201202256. [PubMan] : Schneckenburger, M., Kelsch, M., van Aken, P. A., Richter, G., Spatz, J. P., & Rustom, A. (2012). Cross-sectional characterization of electrodeposited, monocrystalline Au nanowires in parallel arrangement. Small, 8(22), 3396-3399. doi:10.1002/smll.201200963. [PubMan] : Weitz, R. T., Amsharov, K., Zschieschang, U., Burghard, M., Jansen, M., Kelsch, M., Rhamati, B., van Aken, P. A., Kern, K., & Klauk, H. (2009). The importance of grain boundaries for the time-dependent mobility degradation in organic thin-film transistors. Chemistry of Materials, 21(20), 4949-4954. doi:10.1021/cm902145x. [PubMan] : Krauss, T. N., Barrena, E., Lohmüller, T., Kelsch, M., Breitling, A., Van Aken, P. A., Spatz, J., & Dosch, H. (2009). One-dimensional phthalocyanine nanostructures directed by gold templates. Chemistry of Materials, 21, 5010-5015. doi:10.1021/cm901103f. [PubMan] : Richter, G., Hillerich, K., Kelsch, M., Hahn, K., & Lang, D. (2009). Investigation of single-crystalline nano-whiskers by different TEM-methods. In W. Grogger, F. Hofer, & P. Pölt (Eds. ), MC2009. Vol. 3: Materials Science (pp. 99-100). Graz: Verlag der Technischen Universität Graz, Austria. [PubMan] : Dunlop, I. E., Zorn, S., Richter, G., Srot, V., Kelsch, M., van Aken, P. A., Skoda, M., Gerlach, A., Spatz, J. P., & Schreiber, F. (2009). Titanium–silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy. Thin Solid Films, 517, 2048-2054. doi:10.1016/j.tsf.2008.10.058. [PubMan] : Barrena, E., Zhang, X.., Mbenkum, B. N., Lohmüller, T., Krauss, T. N., Kelsch, M., van Aken, P. A., Spatz, J. P., & Dosch, H. (2008). Self-assembly of phthalocyanine nanotubes by vapor-phase transport. ChemPhysChem, 9, 1114-1116. [PubMan] : Mbenkum, B. N., Barrena, E., Zhang, X.., Kelsch, M., & Dosch, H. (2006). Selective growth of organic 1-D structures on Au nanoparticle arrays. Nano Letters, 6(12), 2852-2855. [PubMan] : Sellner, S., Kelsch, M., Kasper, N., Dosch, H., Ulbricht, G., Gerlach, A., Schreiber, F., Meyer, S., Pflaum, J., Fischer, M., & Gompf, B. (2006). Mechanisms for the enhancement of the thermal stability of organic thin films by aluminum oxide capping layers. Journal of Materials Research, 21(2), 455-464. [PubMan] : Jin-Phillipp, N. Y., Thomas, J., Kelsch, M., Deneke, C., Songmuang, R., & Schmidt, O. G. (2006). Electron microscopy study on structure of rolled-up semiconductor nanotubes. Applied Physics Letters, 88: 033113. [PubMan] : Ramsteiner, I. B., Schöps, A., Phillipp, F., Kelsch, M., Reichert, H., & Dosch, H. (2006). High-energy x-ray and transmission electron microscopy study of structural transformations in Ti-V. Physical Review B, 73: 024204. [PubMan] : Jin-Phillipp, N., Kelsch, M., Sycha, M., Thomas, J., & Rühle, M. (2004). Cross-sectional TEM study on metal/carbon nanotube interface. In I. Anderson, R. Price, E. Hall, E. Clark, & S. McKernan (Eds. ), Proceedings Microscopy and Microanalysis 2004, Suppl. 2 (pp. 280CD-281CD). New York, USA: Press Syndicate of the University of Cambridge. [PubMan] : Jin-Phillipp, N., Kelsch, M., Sycha, M., Thomas, J., & Rühle, M. (2004). Cross-sectional TEM study on metal/carbon nanotube interface. In I. Anderson, R. Price, E. Hall, E. Clark, & S. McKernan (Eds. ), Proceedings Microscopy and Microanalysis 2004, Suppl. 2 (pp. 280CD-281CD). New York, USA: Press Syndicate of the University of Cambridge. [PubMan] : Weigand, H., Sprengel, W., Rower, R., Schaefer, H. E., Wejrzanowski, T., & Kelsch, M. (2004). Interfacial free volumes and segregation effects in nanocrystalline Pd85Zr15 studied by positron annihilation. Applied Physics Letters, 84(17), 3370-3372. [PubMan] : Jin-Phillipp, N. Y., Sata, N., Maier, J., Scheu, C., Hahn, K., Kelsch, M., & Rühle, M. (2004). Structures of BaF2/CaF2 heterolayers and their influences on ionic conductivity. Journal of Chemical Physics, 120, 2375-2381. [PubMan] : Sellner, S., Gerlach, A., Schreiber, F., Kelsch, M., Kasper, N., Dosch, H., Meyer, S., Pflaum, J., Fischer, M., & Gompf, B. (2004). Strongly enhanced thermal stability of crystalline organic thin films induced by aluminium oxide capping layers. Advanced Materials, 16, 1750-1753. [PubMan] : Tsai, J. L., Chin, T. S., Yao, Y. D., Melsheimer, A., Fischer, S. F., Dragon, T., Kelsch, M., & Kronmüller, H. (2003). Magnetic properties of [NdFeBx/Nbz]n multilayer films. Journal of Applied Physics, 93(10), 6915-6917. [PubMan] : Dürr, A. C., Schreiber, F., Kelsch, M., Carstanjen, H. D., Dosch, H., & Seeck, O. H. (2003). Morphology and interdiffusion behavior of evaporated metal films on crystalline diindenoperylene thin films. Journal of Applied Physics, 93(9), 5201-5209. [PubMan] : Tsai, J. L., Chin, T. S., Yao, Y. D., Melsheimer, A., Fischer, S. F., Dragon, T., Kelsch, M., & Kronmüller, H. (2003). Preparation and properties of [NdFeBx/Nbz]n multi-layer films. Physica B-Condensed Matter, 327(2-4), 283-286. [PubMan] : Dürr, A. C., Koch, N., Kelsch, M., Rühm, A., Ghijsen, J., Johnson, R. L., Pireaux, J. J., Schwartz, J., Schreiber, F., Dosch, H., & Kahn, A. (2003). Interplay between morphology, structure, and electronic properties at diindenoperylene-gold interfaces. Physical Review B, 68: 115428. [PubMan] : Dürr, A. C., Schreiber, F., Kelsch, M., & Dosch, H. (2003). Optimized preparation of cross-sectional TEM specimens of organic thin films. Ultramicroscopy, 98(1), 51-55. [PubMan] : Strecker, A., Bäder, U., Kelsch, M., Salzberger, U., Sycha, M., Gao, M., Richter, G., & van Benthem, K. (2003). Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning. Zeitschrift für Metallkunde, 94, 290-297. [PubMan]