Surface enhanced Raman spectroscopy and Scanning Kelvin Probe studies of 
corrosive de-adhesion at polymer-metal interfaces

Santa, M.; Posner, R.; Grundmeier, G.

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Surface enhanced Raman spectroscopy and Scanning Kelvin Probe studies of corrosive de-adhesion at polymer-metal interfaces

Santa, M., Posner, R., & Grundmeier, G. (2008). Surface enhanced Raman spectroscopy and Scanning Kelvin Probe studies of corrosive de-adhesion at polymer-metal interfaces. Poster presented at The 59th Annual Meeting of the International Society of Electrochemistry, Seville, Spain.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-467F-4 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4681-D

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Urheber:
Santa, M.¹, Autor
Posner, R.², Autor
Grundmeier, G.², Autor

Affiliations:
1Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863349
2Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353