Atomic-scale characterization of the CdS/CuInSe2 interface in thin-film solar 
cells

Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.

doi:10.1063/1.3560308

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Atomic-scale characterization of the CdS/CuInSe₂ interface in thin-film solar cells

Cojocaru-Mirédin, O., Choi, P., Wuerz, R., & Raabe, D. (2011). Atomic-scale characterization of the CdS/CuInSe₂ interface in thin-film solar cells. Applied Physics Letters, 98, 103504-1-103504-3. doi:10.1063/1.3560308.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3425-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3427-6

Genre: Journal Article

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Creators:
Cojocaru-Mirédin, O.¹, Author
Choi, P.¹, Author
Wuerz, R., Author
Raabe, D.², Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Date issued: 2011

Publication Status: Issued

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Identifiers: eDoc: 569969
DOI: 10.1063/1.3560308

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Title: Applied Physics Letters

Alternative Title : Appl. Phys. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 98 Sequence Number: - Start / End Page: 103504-1 - 103504-3 Identifier: -