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  Quantitative electron channelling contrast imaging: A promising tool for the study of dislocation structures in SEM

Gutierrez-Urrutia, I., Zaefferer, S., & Raabe, D. (2009). Quantitative electron channelling contrast imaging: A promising tool for the study of dislocation structures in SEM. Talk presented at Electron Backscatter Diffraction Meeting. Swansea, UK. 2009-03-30 - 2009-03-31.

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 Creators:
Gutierrez-Urrutia, I.1, Author           
Zaefferer, S.2, Author           
Raabe, D.1, Author           
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 429335
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Title: Electron Backscatter Diffraction Meeting
Place of Event: Swansea, UK
Start-/End Date: 2009-03-30 - 2009-03-31

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