English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Full field X-ray imaging - microanalysis between table top and free electron laser experiments

Soltau, H., Hartmann, R., Hartmann, A., Holl, P., Ihle, S., Thamm, C., et al. (2011). Full field X-ray imaging - microanalysis between table top and free electron laser experiments. Microscopy and Microanalysis, 17(Supplement 2), 910-911. doi:10.1017/S1431927611005423.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-4EE6-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-4EE7-C
Genre: Conference Paper

Files

show Files
hide Files
:
soltau.pdf (Any fulltext), 510KB
 
File Permalink:
-
Name:
soltau.pdf
Description:
-
OA-Status:
Visibility:
Private
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
-
License:
-

Locators

show

Creators

show
hide
 Creators:
Soltau, H., Author
Hartmann, R., Author
Hartmann, A., Author
Holl, P., Author
Ihle, S., Author
Thamm, Ch., Author
Liebel, A., Author
Ordavo, I., Author
Schaller, G.1, Author           
Schopper, F.1, Author           
Strüder, L.1, Author           
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2011-10
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1017/S1431927611005423
Other: LOCALID: 1404667
 Degree: -

Event

show
hide
Title: Microscopy and Microanalysis 2011
Place of Event: Nashville, Tennessee, USA
Start-/End Date: 2011-08-07 - 2011-08-11

Legal Case

show

Project information

show

Source 1

show
hide
Title: Microscopy and Microanalysis
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 17 (Supplement 2) Sequence Number: - Start / End Page: 910 - 911 Identifier: ISSN: 1431-9276