Antireflective layers on thin metal films for mid‐infrared internal reflection 
spectroscopy

Reithmeier, M.; Erbe, A.

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Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy

Reithmeier, M., & Erbe, A. (2010). Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Poster presented at Optical Interference Coatings - Topical Meeting, Tucson, AZ, USA.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-38F8-3 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0002-902B-B

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Urheber:
Reithmeier, M.¹, Autor
Erbe, A.¹, Autor

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358