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  Characterization of the microstructure of Al-rich TiAl alloys by combined TEM imaging techniques

Kelm, K., Irsen, S. H., Paninski, M., Drevermann, A., Schmitz, G. J., Palm, M., et al. (2007). Characterization of the microstructure of Al-rich TiAl alloys by combined TEM imaging techniques. Microscopy and Microanalysis, 13(3), 294-295.

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 Creators:
Kelm, Klemens1, Author           
Irsen, Stephan H.2, Author           
Paninski, M.3, Author           
Drevermann, Anne4, Author           
Schmitz, Georg J.4, Author           
Palm, Martin5, Author           
Stein, Frank5, Author           
Heilmaier, Martin6, Author           
Engberding, Nico5, Author           
Saage, Holger6, Author           
Sturm, Daniel7, Author           
Affiliations:
1Stiftung caesar, Electron Microscopy, Bonn, Germany, ou_persistent22              
2Research Center Caesar, Ludwig-Erhard-Allee 2, D-53175 Bonn, Germany, ou_persistent22              
3ACCESS e.V., Intzestraße 5, D-52072 Aachen, Germany, ou_persistent22              
4ACCESS e.V., D-52072 Aachen, Germany, ou_persistent22              
5Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863368              
6Otto-von-Guericke-Universität Magdeburg, Institut für Werkstoff- und Fügetechnik, Lehrstuhl Werkstoffprüftechnik, Grobe Steinernetischstrabe 6, Magdeburg, Germany, ou_persistent22              
7Otto-von-Guericke University Magdeburg, Institute for Materials Joining and Technology, D-39104 Magdeburg, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 337581
 Degree: -

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Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: New York, NY : Springer-Verlag New York
Pages: - Volume / Issue: 13 (3) Sequence Number: - Start / End Page: 294 - 295 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414