Simulation of probing the electric double layer by scanning electrochemical 
potential microscopy (SECPM)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.

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Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM)

Hamou, R. F., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2009). Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). Talk presented at 11th International Fischer Symposium on Microscopy in Electrochemistry. Benediktbeuern, Germany. 2009-07 - 2009-07.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4084-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4086-F

Genre: Talk

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Creators:
Hamou, R. F.¹, Author
Biedermann, P. U.², Author
Erbe, A.³, Author
Rohwerder, M.^{1, 4}, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
4Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863352

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Language(s): eng - English

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Identifiers: eDoc: 446606

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Title: 11th International Fischer Symposium on Microscopy in Electrochemistry

Place of Event: Benediktbeuern, Germany

Start-/End Date: 2009-07 - 2009-07

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