English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Advanced Calculations for Defects in Materials: Electronic Structure Methods

Alkauskas, A., Deak, P., Neugebauer, J., Pasquarello, A., & van de Walle, C. G. (Eds.). (2011). Advanced Calculations for Defects in Materials: Electronic Structure Methods (WILEY-VCH). Weinheim, Germany: WILEY-VCH Verlag GmbH & Co. KGaA.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Alkauskas, A., Editor
Deak, P., Editor
Neugebauer, J.1, Editor           
Pasquarello, A., Editor
van de Walle, C. G., Editor
Affiliations:
1Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2011-06-18
 Publication Status: Issued
 Pages: 384
 Publishing info: Weinheim, Germany : WILEY-VCH Verlag GmbH & Co. KGaA, WILEY-VCH
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 626167
ISBN: 978-3-527-41024-8
DOI: 10.1002/9783527638529
 Degree: -

Event

show

Legal Case

show

Project information

show

Source

show