Ratajczak, J., Łaszcz, A., Czerwinski, A., Katcki, J., Phillipp, F., van Aken, P. A., Reckinger, N., & Dupois, E. (2010). Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. Journal of Microscopy, 237(3), 379-383.