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  Creep behavior of γ-TiAl-based alloys with fully lamellar microstructure

Chatterjee, A., Clemens, H., Mecking, H., Dehm, G., & Arzt, E. (2001). Creep behavior of γ-TiAl-based alloys with fully lamellar microstructure. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques, 92(8), 1000-1004.

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 Creators:
Chatterjee, Anita1, Author           
Clemens, Helmut1, Author           
Mecking, Heinrich2, Author           
Dehm, Gerhard1, Author           
Arzt, Eduard1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Max-Planck-Inst. fur Metallforschung, Seestr. 92, D-70174 Stuttgart, Germany, persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt; gamma-TiAl; creep; fully lamellar; dislocation
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Language(s): eng - English
 Dates: 2001-08
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 21010
ISI: 000171455000023
 Degree: -

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Title: Zeitschrift für Metallkunde/Materials Research and Advanced Techniques
  Other : Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques
  Abbreviation : Z. Metallk.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: München : Hanser
Pages: - Volume / Issue: 92 (8) Sequence Number: - Start / End Page: 1000 - 1004 Identifier: ISSN: 0044-3093
CoNE: https://pure.mpg.de/cone/journals/resource/1000000000221480