Gault, B., Breen, A. J., Chang, Y., He, J., Jägle, E. A., Kontis, P., Kürnsteiner, P., Kwiatkowski da Silva, A., Makineni, S. K., Mouton, I., Peng, Z., Ponge, D., Schwarz, T., Stephenson, L., Szczepaniak, A., Zhao, H., & Raabe, D. (2018). Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations. Journal of Materials Research, 33(23), 4018-4030. doi:10.1557/jmr.2018.375.