Stimulated emission depletion microscopy with a single offset beam.

Klar, T. A.; Dyba, M.; Hell, S. W.

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Stimulated emission depletion microscopy with a single offset beam.

Klar, T. A., Dyba, M., & Hell, S. W. (2001). Stimulated emission depletion microscopy with a single offset beam. Applied Physics Letters, 78(4), 393-395. Retrieved from http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000078000004000393000001&idtype=cvips&doi=10.1063/1.1338491&prog=normal.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0012-F552-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-E35E-F

Genre: Journal Article

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Creators:
Klar, T. A.¹, Author
Dyba, M.², Author
Hell, S. W.¹, Author

Affiliations:
1Department of NanoBiophotonics, MPI for biophysical chemistry, Max Planck Society, ou_578627
2Max Planck Society, ou_persistent13

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Language(s): eng - English

Dates: Date issued: 2001-01-22

Publication Status: Issued

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Identifiers: eDoc: 227002
URI: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000078000004000393000001&idtype=cvips&doi=10.1063/1.1338491&prog=normal

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 78 (4) Sequence Number: - Start / End Page: 393 - 395 Identifier: -