Load-free determination of film structure dependent tunneling decay factors in 
molecular junctions

Munuera, C.; Ocal, C.

doi:10.1021/jp901273t

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Load-free determination of film structure dependent tunneling decay factors in molecular junctions

Munuera, C., & Ocal, C. (2009). Load-free determination of film structure dependent tunneling decay factors in molecular junctions. Journal of Physical Chemistry C, 113, 21903-21910. doi:10.1021/jp901273t.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C59-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C5A-9

Genre: Journal Article

Alternative Title : J. Phys. Chem. C

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Creators:
Munuera, C.¹, Author
Ocal, C.², Author

Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
2Institut de Ciència de Materials de Barcelona, Consejo Superior de Investigaciones Científical (CSIC), Campus de la UAB, Bellaterra, 08193-Cerdanyola del Vallès, Spain, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch/Rühle;

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Language(s): eng - English

Dates: Date issued: 2009-12-03

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 446569
DOI: 10.1021/jp901273t

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Title: Journal of Physical Chemistry C

Alternative Title : J. Phys. Chem. C

Source Genre: Journal

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Pages: - Volume / Issue: 113 Sequence Number: - Start / End Page: 21903 - 21910 Identifier: -