ESA athena WFI onboard electronics - distributed control and data processing

Plattner, Markus; Ott, Sabine; Albrecht, Sebastian; Tran, Jintin; Mandla, Christopher; Tenzer, Jan-Christoph; Schanz, Thomas; Pliego, Samuel; Tcherniak, Denis; Steller, Manfred; Jeszensky, Harald; Ottensamer, Roland; Skup, Konrad; Thomas, Chris; Thornhill, Julian

doi:10.23919/DATE48585.2020.9116484

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ESA athena WFI onboard electronics - distributed control and data processing

Plattner, M., Ott, S., Albrecht, S., Tran, J., Mandla, C., Tenzer, J.-C., et al. (2020). ESA athena WFI onboard electronics - distributed control and data processing. In Proceedings of the 2017 Design, Automation & Test in Europe (pp. 163-168). Piscataway, NJ: IEEE. doi:10.23919/DATE48585.2020.9116484.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0008-15BC-D Version Permalink: https://hdl.handle.net/21.11116/0000-0008-15BD-C

Genre: Conference Paper

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Creators:
Plattner, Markus¹, Author
Ott, Sabine², Author
Albrecht, Sebastian¹, Author
Tran, Jintin¹, Author
Mandla, Christopher¹, Author
Tenzer, Jan-Christoph, Author
Schanz, Thomas, Author
Pliego, Samuel, Author
Tcherniak, Denis, Author
Steller, Manfred, Author
Jeszensky, Harald, Author
Ottensamer, Roland, Author
Skup, Konrad, Author
Thomas, Chris, Author
Thornhill, Julian, Author

Affiliations:
1MPI for Extraterrestrial Physics, Max Planck Society, ou_159888
2High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890

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Abstract: Within this paper, we describe architecture and functionality of the Wide Field Imager (WFI) control and data processing electronics. WFI is one of two scientific instruments of the next European X-ray observatory ATHENA whose development started five years ago. A conceptual design, development models and a number of technology development activities have been performed and results will be shown.

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Language(s): eng - English

Dates: Published Online: 2020Date issued: 2020

Publication Status: Issued

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Identifiers: DOI: 10.23919/DATE48585.2020.9116484
Other: LOCALID: 3289727

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Title: Design, Automation and Test in Europe Conference and Exhibition (DATE)

Place of Event: Grenoble, France

Start-/End Date: 2020-03-09 - 2020-03-13

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Title: Proceedings of the 2017 Design, Automation & Test in Europe

Abbreviation : 2020 Design

Source Genre: Proceedings

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Publ. Info: Piscataway, NJ : IEEE

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 163 - 168 Identifier: ISBN: 978-3-9819263-4-7