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  Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy

Karel, J., Casoli, F., Lupo, P., Nasi, L., Fabbrici, S., Righi, L., et al. (2016). Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy. Scripta Materialia, 114, 165-169. doi:10.1016/j.scriptamat.2015.11.019.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-C6B9-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-0059-B
Genre: Journal Article

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 Creators:
Karel, J.1, Author           
Casoli, F.2, Author
Lupo, P.2, Author
Nasi, L.2, Author
Fabbrici, S.2, Author
Righi, L.2, Author
Albertini, F.2, Author
Felser, C.3, Author           
Affiliations:
1Julie Karel, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863434              
2External Organizations, ou_persistent22              
3Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429              

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 Abstract: Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 degrees C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 degrees C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane. (C) 2015 Elsevier Ltd. All rights reserved.

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Language(s): eng - English
 Dates: 2016-02-102016-02-10
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1016/j.scriptamat.2015.11.019
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Title: Scripta Materialia
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B. V.
Pages: - Volume / Issue: 114 Sequence Number: - Start / End Page: 165 - 169 Identifier: ISSN: 1359-6462
CoNE: https://pure.mpg.de/cone/journals/resource/954926243506