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  Combined Atom probe tomography, Electron backscattering diffraction and Transmission electron microscopy experiments of Ag16.7Sb30Te53.3 bulk thermoelectric material

Abdellaoui, L., Cojocaru-Mirédin, O., Nagli, M., Amouyal, Y., Yu, Y., Zhang, S., et al. (2016). Combined Atom probe tomography, Electron backscattering diffraction and Transmission electron microscopy experiments of Ag16.7Sb30Te53.3 bulk thermoelectric material. Poster presented at MSE 2016, Darmstadt, Germany.

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 Creators:
Abdellaoui, Lamya1, Author           
Cojocaru-Mirédin, Oana2, Author           
Nagli, Michael3, Author           
Amouyal, Yaron3, Author           
Yu, Yuan4, Author           
Zhang, Siyuan1, Author           
Raabe, Dierk5, Author           
Wuttig, Matthias6, Author           
Scheu, Christina1, Author           
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, persistent22              
3Technion, Israel Institute of Technology, Haifa, Israel, persistent22              
4RWTH Aachen University, I. Physikalisches Institut IA, 52056 Aachen, Germany, persistent22              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
6RWTH Aachen University, I. Physikalisches Institut IA, 52056 Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2016-09
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
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Title: MSE 2016
Place of Event: Darmstadt, Germany
Start-/End Date: 2016-09-27 - 2016-09-29

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