Local Measurements of the Semi conducting Properties of alpha-Fe2O3 and Cr2O3 
Films by Impedance Measurement using the Scanning Droplet Cell Technique

Asteman, H.; Lill, K.; Hassel, A. W.; Spiegel, M.

Local TagsRelease HistoryDetailsSummary

Local Measurements of the Semi conducting Properties of alpha-Fe₂O₃ and Cr₂O₃ Films by Impedance Measurement using the Scanning Droplet Cell Technique

Asteman, H., Lill, K., Hassel, A. W., & Spiegel, M. (2005). Local Measurements of the Semi conducting Properties of alpha-Fe₂O₃ and Cr₂O₃ Films by Impedance Measurement using the Scanning Droplet Cell Technique. Talk presented at 9th International Symposium on the Passivity of Metals and Semiconductors. Paris, France. 2005-06-27 - 2005-07-01.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5F3B-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5F3D-D

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Asteman, H.¹, Author
Lill, K.², Author
Hassel, A. W.², Author
Spiegel, M.¹, Author

Affiliations:
1High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863356
2Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 228535

Degree: -

Event

show

hide

Title: 9th International Symposium on the Passivity of Metals and Semiconductors

Place of Event: Paris, France

Start-/End Date: 2005-06-27 - 2005-07-01

Legal Case

show

Project information

show

Source

show