Damage analysis in Al thin films fatigued at ultrahigh frequencies

Eberl, C.; Spolenak, R.; Kraft, O.; Kubat, F.; Ruile, W.; Arzt, E.

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Damage analysis in Al thin films fatigued at ultrahigh frequencies

Eberl, C., Spolenak, R., Kraft, O., Kubat, F., Ruile, W., & Arzt, E. (2006). Damage analysis in Al thin films fatigued at ultrahigh frequencies. Journal of Applied Physics, 99: 113501.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46FA-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46FB-0

Genre: Journal Article

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Creators:
Eberl, C.¹, Author
Spolenak, R.¹, Author
Kraft, O.¹, Author
Kubat, F.², Author
Ruile, W.², Author
Arzt, E.^{1, 3}, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
2Institut für Metallkunde, Universität Stuttgart; Laboratory for Nanometallurgy, Department of Materials, ETH Zurich, Switzerland; Institut für Materialforschung II, Forschungszentrum Karlsruhe; Institut für Zuverlässigkeit von Bauteilen und Systemen, Universität Karlsruhe; EPCOS AG, München, ou_persistent22
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Arzt;

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

Pages: 8 pages

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Rev. Type: Peer

Identifiers: eDoc: 284876

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Title: Journal of Applied Physics

Source Genre: Journal

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Pages: - Volume / Issue: 99 Sequence Number: 113501 Start / End Page: - Identifier: -