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Schlagwörter:
Anisotropy; Piezoelectricity; X ray diffraction, In-situ experiments; In-situ synchrotrons; In-situ X-ray diffraction; Piezo-effect; Piezoelectric anisotropy; Piezoelectric coefficient; Piezoelectric property; Piezoelectric response, Thin films
Zusammenfassung:
Piezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using micro-sized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d33 was calculated in terms of the lab reference frame (dperp) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the dperp amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. © 2016 Elsevier B.V. All rights reserved.
