Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission 
Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

Stoffers, Andreas; Barthel, Juri; Liebscher, Christian; Gault, Baptiste; Cojocaru-Mirédin, Oana; Scheu, Christina; Raabe, Dierk

doi:10.1017/S1431927617000034

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Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

Stoffers, A., Barthel, J., Liebscher, C., Gault, B., Cojocaru-Mirédin, O., Scheu, C., et al. (2017). Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries. Microscopy and Microanalysis, 23(2), 291-299. doi:10.1017/S1431927617000034.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-A6A6-B Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6C9F-4

Genre: Journal Article

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Creators:
Stoffers, Andreas^{1, 2}, Author
Barthel, Juri^{3, 4}, Author
Liebscher, Christian⁵, Author
Gault, Baptiste⁶, Author
Cojocaru-Mirédin, Oana^{1, 2}, Author
Scheu, Christina⁷, Author
Raabe, Dierk¹, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, persistent22
3Central Facility for Electron Microscopy, RWTH Aachen University, Ahornstraβe 55, 52074 Aachen, Germany, persistent22
4Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany, persistent22
5Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
6Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
7Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Published Online: 2017-02-20Date issued: 2017-04

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1017/S1431927617000034

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Title: Microscopy and Microanalysis

Abbreviation : Microsc. Microanal.

Source Genre: Journal

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Pages: - Volume / Issue: 23 (2) Sequence Number: - Start / End Page: 291 - 299 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414