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  FIB damage of Cu and possible consequences for miniaturized mechanical tests

Kiener, D., Motz, C., Rester, M., Jenko, M., & Dehm, G. (2007). FIB damage of Cu and possible consequences for miniaturized mechanical tests. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing, 459(1-2), 262-272. doi:10.1016/j.msea.2007.01.046.

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 Creators:
Kiener, Daniel1, 2, Author           
Motz, Christian2, Author           
Rester, Martin3, Author           
Jenko, Monika4, Author           
Dehm, Gerhard2, 5, Author           
Affiliations:
1Materials Center Leoben Forschungs GmbH, Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
3Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
4Institute of Metals and Technology, SI-1000 Ljubljana, Slovenia, ou_persistent22              
5Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2007-06-25
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.msea.2007.01.046
 Degree: -

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Title: Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing
  Abbreviation : Mater. Sci. Eng. A: Struct. Mater. Prop. Microstruct. Process.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY : Elsevier
Pages: - Volume / Issue: 459 (1-2) Sequence Number: - Start / End Page: 262 - 272 Identifier: ISSN: 0921-5093
CoNE: https://pure.mpg.de/cone/journals/resource/954928498465_1