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  SIESTA: a new high-current ion source for angle-dependent sputter yield measurements

Arredondo Parra, R., Oberkofler, M., Schwarz-Selinger, T., & Schmid, K. (2018). SIESTA: a new high-current ion source for angle-dependent sputter yield measurements. Poster presented at 82. Jahrestagung der DPG und DPG-Frühjahrstagung der Sektion AMOP, Erlangen.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-C67A-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-C67B-7
Genre: Poster

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 Creators:
Arredondo Parra, R.1, 2, Author           
Oberkofler, M.1, Author           
Schwarz-Selinger, T.1, Author           
Schmid, K.1, Author           
Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
2External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2017
 Publication Status: Submitted
 Pages: -
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 Table of Contents: -
 Rev. Type: -
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Title: 82. Jahrestagung der DPG und DPG-Frühjahrstagung der Sektion AMOP
Place of Event: Erlangen
Start-/End Date: 2018-03-04 - 2018-03-09

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Title: Verhandl. DPG
  Other : Verhandlungen der Deutschen Physikalischen Gesellschaft
Source Genre: Journal
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Publ. Info: Bad Honnef : DPG
Pages: - Volume / Issue: (VI) 53 (2) Sequence Number: P 15.1 Start / End Page: - Identifier: CoNE: https://pure.mpg.de/cone/journals/resource/04200195