Electron channeling contrast imaging: A powerful technique for quantitative 
microstructural characterization of deformed materials in the SEM

Gutiérrez-Urrutia, I.

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Electron channeling contrast imaging: A powerful technique for quantitative microstructural characterization of deformed materials in the SEM

Gutiérrez-Urrutia, I. (2012). Electron channeling contrast imaging: A powerful technique for quantitative microstructural characterization of deformed materials in the SEM. Talk presented at Seminar at Bundesanstalt fuer Materialforschung-pruefung (BAM). Berlin, Germany. 2012-02-17.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2B4E-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2B50-B

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Creators:
Gutiérrez-Urrutia, I.¹, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

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Identifiers: eDoc: 580673

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Title: Seminar at Bundesanstalt fuer Materialforschung-pruefung (BAM)

Place of Event: Berlin, Germany

Start-/End Date: 2012-02-17

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