Zaefferer, S., Konrad, J., & Raabe, D. (2005). 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Talk presented at Microscopy Conference 2005. Davos, Switzerland. 2005-08-08 - 2005-09-02.