Evolution of faceted voids and fingering instabilities in a model thin film 
system - Insights by in-situ environmental scanning electron microscopy

Hieke, Stefan Werner; Willinger, Marc Georg; Wang, Zhu-Jun; Richter, Gunther; Dehm, Gerhard; Scheu, Christina

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Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Talk presented at Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg. Erlangen, Germany. 2017-10-09.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-FFD3-2 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-FFD4-1

Genre: Vortrag

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Urheber:
Hieke, Stefan Werner¹, Autor
Willinger, Marc Georg², Autor
Wang, Zhu-Jun², Autor
Richter, Gunther³, Autor
Dehm, Gerhard⁴, Autor
Scheu, Christina^{1, 5}, Autor

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023
3Central Scientific Facility Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
5Materials Analytics, RWTH Aachen University, Kopernikusstrasse 10, Aachen, Germany, ou_persistent22