X-ray μLaue: A novel view on fatigue damage at the micron scale

Kirchlechner, Christoph; Liegl, Wolfgang; Motz, Christian; Dehm, Gerhard

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X-ray μLaue: A novel view on fatigue damage at the micron scale

Kirchlechner, C., Liegl, W., Motz, C., & Dehm, G. (2013). X-ray μLaue: A novel view on fatigue damage at the micron scale. Talk presented at ECI on Nanomechanical Testing 2013. Olhão (Algarve), Portugal. 2013-10-06 - 2013-10-11.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-20F6-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-AB45-7

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Urheber:
Kirchlechner, Christoph¹, Autor
Liegl, Wolfgang², Autor
Motz, Christian³, Autor
Dehm, Gerhard⁴, Autor

Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
3Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398