Revisiting Field Ion Microscopy

Gault, Baptiste; Dagan, Michal; Katnagallu, Shyam; De Geuser, Frédéric; Vurpillot, François; Raabe, Dierk; Moody, Michael P.

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Revisiting Field Ion Microscopy

Gault, B., Dagan, M., Katnagallu, S., De Geuser, F., Vurpillot, F., Raabe, D., et al. (2017). Revisiting Field Ion Microscopy. Talk presented at TMS 2017. San Diego, CA, USA. 2017-02-26 - 2017-03-02.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-C597-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-EA39-C

Genre: Talk

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Creators:
Gault, Baptiste¹, Author
Dagan, Michal², Author
Katnagallu, Shyam¹, Author
De Geuser, Frédéric^{3, 4}, Author
Vurpillot, François⁵, Author
Raabe, Dierk⁶, Author
Moody, Michael P.⁷, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH UK, persistent22
3Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22
4CNRS, SIMAP, F-38000 Grenoble, France, persistent22
5The Sir William Dunn School of Pathology, University of Oxford, Oxford, UK, persistent22
6Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
7Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22

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Language(s): eng - English

Dates: Created: 2017

Publication Status: Not specified

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Title: TMS 2017

Place of Event: San Diego, CA, USA

Start-/End Date: 2017-02-26 - 2017-03-02

Invited: Yes

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