Orientation microscopy in SEM and TEM: A critical review

Zaefferer, S.

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Orientation microscopy in SEM and TEM: A critical review

Zaefferer, S. (2011). Orientation microscopy in SEM and TEM: A critical review. Crystal Research and Technology, 46, 607-628.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3515-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3517-2

Genre: Journal Article

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Creators:
Zaefferer, S.¹, Author

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1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Date issued: 2011

Publication Status: Issued

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Identifiers: eDoc: 624796

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Title: Crystal Research and Technology

Alternative Title : Cryst. Res. Technol.

Source Genre: Journal

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Pages: - Volume / Issue: 46 Sequence Number: - Start / End Page: 607 - 628 Identifier: -