Dislocations, grain boundaries and strain fields observed on bulk samples: high 
resolution defect analysis by scanning electron microscopy-based diffraction 
techniques

Zaefferer, Stefan; Ram, Farangis; Mandal, Suvendu; Raabe, Dierk

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Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques

Zaefferer, S., Ram, F., Mandal, S., & Raabe, D. (2015). Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques. Talk presented at ICOTOM 17; invited plenary. Dresden, Germany. 2015-08-24 - 2015-08-29.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45CE-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-45CF-7

Genre: Talk

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Creators:
Zaefferer, Stefan¹, Author
Ram, Farangis¹, Author
Mandal, Suvendu², Author
Raabe, Dierk³, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Theory and Simulation of Complex Fluids, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863393
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2015-08

Publication Status: Not specified

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Title: ICOTOM 17; invited plenary

Place of Event: Dresden, Germany

Start-/End Date: 2015-08-24 - 2015-08-29

Invited: Yes

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