The electron backscatter diffraction (EBSD) technique – Fundamentals and 
applications

Zaefferer, S.

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The electron backscatter diffraction (EBSD) technique – Fundamentals and applications

Zaefferer, S. (2008). The electron backscatter diffraction (EBSD) technique – Fundamentals and applications. Workshop at the annual meeting of the Canadian Microscopical Society 2008. Montreal, Canada, 2008-05-20.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-49BD-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-49BF-B

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Creators:
Zaefferer, S.¹, Author

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1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

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Identifiers: eDoc: 378204

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Title: Workshop at the annual meeting of the Canadian Microscopical Society 2008

Place of Event: Montreal, Canada

Start-/End Date: 2008-05-20

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