Evaluation of EELS spectrum imaging data by spectral components and factors 
from multivariate analysis

Zhang, Siyuan; Scheu, Christina

doi:10.1093/jmicro/dfx091

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Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis

Zhang, S., & Scheu, C. (2018). Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis. Microscopy, 67(suppl_1), i133-i141. doi:10.1093/jmicro/dfx091.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-4978-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-497A-5

Genre: Journal Article

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Creators:
Zhang, Siyuan¹, Author
Scheu, Christina^{1, 2}, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Materials Analytics, RWTH Aachen University, Kopernikusstrasse 10, Aachen, Germany, ou_persistent22

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Language(s): eng - English

Dates: Published Online: 2017-11-09Date issued: 2018-03-01

Publication Status: Issued

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Identifiers: ISSN: 2050-5698
DOI: 10.1093/jmicro/dfx091

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Title: Microscopy

Other : Journal of Electron Microscopy

Source Genre: Journal

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Publ. Info: Oxford, UK : Oxford University Press

Pages: - Volume / Issue: 67 (suppl_1) Sequence Number: - Start / End Page: i133 - i141 Identifier: ISSN: 2050-5698
CoNE: https://pure.mpg.de/cone/journals/resource/2050-5698