Depth-Profiling of Cu-Ni Sandwich Samples by Secondary Ion Mass Spectrometry

Hofer, W.O.; Liebl, H.

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Depth-Profiling of Cu-Ni Sandwich Samples by Secondary Ion Mass Spectrometry

Hofer, W., & Liebl, H. (1975). Depth-Profiling of Cu-Ni Sandwich Samples by Secondary Ion Mass Spectrometry. Applied Physics, 8, 359-360.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-B7FC-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-B7FD-8

Genre: Journal Article

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Creators:
Hofer, W.O.¹, Author
Liebl, H.², Author

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Dates: Date issued: 1975

Publication Status: Issued

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Title: Applied Physics

Source Genre: Journal

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Pages: - Volume / Issue: 8 Sequence Number: - Start / End Page: 359 - 360 Identifier: -