English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, M. (2016). Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography. Talk presented at Interdisciplinary Symposium on 3D Microscopy, Congress Center, Les Diablerets. Les Diablerets, Switzerland. 2016-10-18 - 2016-10-21.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/21.11116/0000-0000-3E1F-A Version Permalink: https://hdl.handle.net/21.11116/0000-0000-3E20-7
Genre: Talk

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Herbig, Michael1, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2016-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: Interdisciplinary Symposium on 3D Microscopy, Congress Center, Les Diablerets
Place of Event: Les Diablerets, Switzerland
Start-/End Date: 2016-10-18 - 2016-10-21
Invited: Yes

Legal Case

show

Project information

show

Source

show