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  Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction

Davydok, A., Jaya, B. N., Robach, O., Ulrich, O., Micha, J.-S., & Kirchlechner, C. (2016). Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction. Materials and Design, 108, 68-75. doi:10.1016/j.matdes.2016.06.098.

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 Creators:
Davydok, Anton1, Author           
Jaya, Balila Nagamani1, Author           
Robach, Odile2, 3, Author           
Ulrich, Olivier2, 3, Author
Micha, Jean-Sébastien2, 3, Author
Kirchlechner, Christoph1, 4, Author           
Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
2CEA-Grenoble, INAC/SP2M/NRS, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France, ou_persistent22              
3Université Grenoble Alpes, Grenoble F-38000, France, ou_persistent22              
4Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2016-06-242016-10-15
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.matdes.2016.06.098
 Degree: -

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Title: Materials and Design
  Abbreviation : Mater. Des.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 108 Sequence Number: - Start / End Page: 68 - 75 Identifier: ISSN: 0264-1275
CoNE: https://pure.mpg.de/cone/journals/resource/954926234428