Advanced applications of SEM-based diffraction techniques

Zaefferer, S.

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Advanced applications of SEM-based diffraction techniques

Zaefferer, S. (2011). Advanced applications of SEM-based diffraction techniques. Talk presented at IUMAS conference. Seoul, South Korea. 2011-05-26.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-31B8-7 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-42C8-F

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Urheber:
Zaefferer, S.¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391