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  Potential and Limitations of Reflectometry due to Scattering from Density Fluctuations

Hirsch, M., Sanchez, J., Holzhauer, E., & De la Luna, E. (1997). Potential and Limitations of Reflectometry due to Scattering from Density Fluctuations. In 3rd Workshop on Microwave Reflectometry for Fusion Plasma Diagnostics (pp. 21-28).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8C45-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8C46-E
Genre: Conference Paper

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 Creators:
Hirsch, M.1, Author           
Sanchez, J.2, Author
Holzhauer, E.3, Author           
De la Luna, E.2, Author
Affiliations:
1Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856291              
2Max Planck Society, ou_persistent13              
3External Organizations, ou_persistent22              

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 Dates: 1997
 Publication Status: Issued
 Pages: -
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 Rev. Type: Internal
 Identifiers: eDoc: 673893
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Title: 3rd Workshop on Microwave Reflectometry for Fusion Plasma Diagnostics
Place of Event: Madrid (ES)
Start-/End Date: 1997-05-05 - 1997-05-07

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Title: 3rd Workshop on Microwave Reflectometry for Fusion Plasma Diagnostics
Source Genre: Proceedings
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 21 - 28 Identifier: -

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Title: Informes Tecnicos Ciemat
Source Genre: Series
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Pages: - Volume / Issue: 838 Sequence Number: - Start / End Page: - Identifier: -