Analytical transmission electron microscopy

Sigle, W.

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Analytical transmission electron microscopy

Sigle, W. (2005). Analytical transmission electron microscopy. Annual Review of Materials Research, 35, 239-314.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-27C3-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-27C4-4

Genre: Journal Article

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Sigle, W.^{1, 2}, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 240042

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Title: Annual Review of Materials Research

Source Genre: Journal

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Pages: - Volume / Issue: 35 Sequence Number: - Start / End Page: 239 - 314 Identifier: -