Controlling Film Properties in Microstructures on Single Grains of Titanium; A 
SDC, SECM and Imaging Ellipsometry Study

Hassel, A. W.; Fushimi, K.; Stratmann, M.; Seo, M.

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Controlling Film Properties in Microstructures on Single Grains of Titanium; A SDC, SECM and Imaging Ellipsometry Study

Hassel, A. W., Fushimi, K., Stratmann, M., & Seo, M. (2003). Controlling Film Properties in Microstructures on Single Grains of Titanium; A SDC, SECM and Imaging Ellipsometry Study. Talk presented at 54rd Annual Meeting of the International Society of Electrochemistry. Sao Pedro, Brazil. 2003-08-31 - 2003-09-05.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-69FF-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6A01-7

Genre: Talk

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Creators:
Hassel, A. W.¹, Author
Fushimi, K.¹, Author
Stratmann, M.², Author
Seo, M., Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355
2Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348

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Identifiers: eDoc: 230090

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Title: 54rd Annual Meeting of the International Society of Electrochemistry

Place of Event: Sao Pedro, Brazil

Start-/End Date: 2003-08-31 - 2003-09-05

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