Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl 
(Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing

Schillinger, Wolfram; Zhang, Dezhi; Dehm, Gerhard; Bartels, Arno; Clemens, Helmut

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Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing

Schillinger, W., Zhang, D., Dehm, G., Bartels, A., & Clemens, H. (2001). Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing. In Materials Research Society Symposium - Proceedings (pp. N141-N146).

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-95CE-F Version Permalink: https://hdl.handle.net/21.11116/0000-0001-95CF-E

Genre: Conference Paper

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Creators:
Schillinger, Wolfram¹, Author
Zhang, Dezhi¹, Author
Dehm, Gerhard², Author
Bartels, Arno³, Author
Clemens, Helmut², Author

Affiliations:
1Materials Science and Technology, TUHH, Hamburg, Germany, persistent22
2Materials Science and Technology, TUHH, Hamburg, Germany, ou_persistent22
3Materials Science and Technology, Technical University Hamburg-Harburg, D-21073 Hamburg, Germany, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

Pages: 6

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Title: Materials Research Society Symposium - High Temperature Ordered Intermetallic Alloys IX, Code 59218

Place of Event: Boston, MA, USA

Start-/End Date: 2000-11-27 - 2000-11-29

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Title: Materials Research Society Symposium - Proceedings

Source Genre: Proceedings

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Pages: - Volume / Issue: 646 Sequence Number: - Start / End Page: N141 - N146 Identifier: -