Reflections on the Projection of Ions in Atom Probe Tomography

De Geuser, Frédéric; Gault, Baptiste

doi:10.1017/S1431927616012721

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Reflections on the Projection of Ions in Atom Probe Tomography

De Geuser, F., & Gault, B. (2017). Reflections on the Projection of Ions in Atom Probe Tomography. Microscopy and Microanalysis, 23(2), 238-246. doi:10.1017/S1431927616012721.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-C4B8-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-C4BC-9

Genre: Journal Article

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Creators:
De Geuser, Frédéric^{1, 2}, Author
Gault, Baptiste³, Author

Affiliations:
1CNRS, SIMAP, F-38000 Grenoble, France, persistent22
2Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384

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Language(s): eng - English

Dates: Published Online: 2017-02-02Date issued: 2017-04

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1017/S1431927616012721

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Title: Microscopy and Microanalysis

Abbreviation : Microsc. Microanal.

Source Genre: Journal

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Pages: 9 Volume / Issue: 23 (2) Sequence Number: - Start / End Page: 238 - 246 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414