Characterization of Mo2BC thin films by transmission electron microscopy methods

Gleich, Stephan; Djaziri, Soundès; Bolvardi, Hamid; Schneider, Jochen Michael; Scheu, Christina

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Characterization of Mo₂BC thin films by transmission electron microscopy methods

Gleich, S., Djaziri, S., Bolvardi, H., Schneider, J. M., & Scheu, C. (2015). Characterization of Mo₂BC thin films by transmission electron microscopy methods. Poster presented at 2nd International Workshop on TEM Spectroscopy, Uppsala, Sweden.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6D6A-F

Genre: Poster

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Creators:
Gleich, Stephan¹, Author
Djaziri, Soundès², Author
Bolvardi, Hamid³, Author
Schneider, Jochen Michael⁴, Author
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
3Materials Chemistry, RWTH Aachen University, Kopernikusstraße 10, D-52074 Aachen, Germany, ou_persistent22
4Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany, ou_persistent22

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Language(s): eng - English

Dates: Created: 2015-05

Publication Status: Not specified

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Title: 2nd International Workshop on TEM Spectroscopy

Place of Event: Uppsala, Sweden

Start-/End Date: 2015-05-18 - 2015-05-20

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