Dynamic Depth Profile Measurements of Implanted Deuterium in Nickel

Petitpierre, O.; Moeller, W.; Scherzer, B.M.U.

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Dynamic Depth Profile Measurements of Implanted Deuterium in Nickel

Petitpierre, O., Moeller, W., & Scherzer, B. (1989). Dynamic Depth Profile Measurements of Implanted Deuterium in Nickel. Journal of Applied Physics, 65, 5, 1893-1897.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C14C-5 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C14D-3

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Urheber:
Petitpierre, O.¹, Autor
Moeller, W.², Autor
Scherzer, B.M.U.³, Autor

Affiliations:
1Max Planck Institute for Plasma Physics, ou_persistent27
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
3External Organizations, ou_persistent22