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  Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Vaxelaire, N., Proudhon, H., Labat, S., Kirchlechner, C., Kečkéš, J., Jacques, V., et al. (2010). Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics, 12: 035018, pp. 1-12. doi:10.1088/1367-2630/12/3/035018.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-001A-24C1-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-001A-24C5-1
Genre: Journal Article
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 Creators:
Vaxelaire, N.1, 2, Author           
Proudhon, H.3, Author           
Labat, S.1, 2, Author           
Kirchlechner, C.4, Author           
Kečkéš, J.4, Author           
Jacques, V.5, Author           
Ravy, S.5, 6, Author           
Forest, S.3, Author           
Thomas, O.1, 2, Author           
Affiliations:
1Aix-Marseille Université, IM2NP, Campus de Saint-Jérôme, Marseille, France, ou_persistent22              
2CNRS, IM2NP (UMR 6242), Campus de Saint-Jérôme, Marseille, France, ou_persistent22              
3MINES ParisTech, Centre des Matériaux, CNRS UMR 7633, BP 87, 91003 Evry Cedex, France, ou_persistent22              
4Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
5Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin BP 48, 91192 Gif-sur-Yvette Cedex, France, ou_persistent22              
6Aix-Marseille Université, F 13397 Marseille Cedex 20, France, ou_persistent22              

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 Abstract: Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.

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Language(s): eng - English
 Dates: 2010-03-31
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1088/1367-2630/12/3/035018
 Degree: -

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Title: New Journal of Physics
Source Genre: Journal
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Publ. Info: Bristol : IOP Publishing
Pages: - Volume / Issue: 12 Sequence Number: 035018 Start / End Page: 1 - 12 Identifier: ISSN: 1367-2630
CoNE: https://pure.mpg.de/cone/journals/resource/954926913666