Quantitative EDX analysis of Bi2Te3 in the TEM

Peranio, N.; Eibl, O.

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Quantitative EDX analysis of Bi₂Te₃ in the TEM

Peranio, N., & Eibl, O. (2005). Quantitative EDX analysis of Bi₂Te₃ in the TEM. In ICT2004. Piscataway, NJ, USA: IEEE.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-62E7-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-62E9-5

Genre: Conference Paper

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Creators:
Peranio, N.¹, Author
Eibl, O., Author

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1External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Identifiers: eDoc: 321577

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Title: 23th International Conference on Thermoelectrics (ICT2004)

Place of Event: Adelaide, Australia

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Title: ICT2004

Source Genre: Proceedings

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Publ. Info: Piscataway, NJ, USA : IEEE

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISBN: 1424401283